device to stabilize for 20 seconds. Temperature coefficient (vz). Test conditions for temperature coefficient are as follows: IZT = 7.5 mA, T1 = 25oC, a. T2 = 125oC (1N5221AUR-1 & BUR-1 thru 1N5242AUR-1 & BUR-1) b. IZT = Rated IZT, T1 = 25oC, T2 = 125oC (1N5243AUR-1 & BUR-1 thru 1N5281AUR-1 & BUR-1) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. These devices may be ordered as either 1N5221UR-1 thru 1N5281BUR-1 or as MLL5221-1 thru MLL5281B-1 part numbers. RATED POWER -mW o TEMPERATURE COEFFICIENT mV/ C TEMPERATURE COEFFICIENT %/ C GRAPHS TEC TA Voltage Temperature o Coefficient %/ C mV Change /C o TEC End Cap Temperature (C), or TA Ambient Temperature on FR4 PC BOARD NOMINAL ZENER VOLTAGE (VOLTS) FIGURE 2 ZENER VOLTAGE TEMPERATURE COEFFICIENT vs. ZENER VOLTAGE FIGURE 1 POWER DERATING CURVE PACKAGE DIMENSIONS DIM A B C INCHES MIN MAX 0.063 0.067 0.130 0.146 0.016 0.022 INCHES .200 .055 .080 1N5221UR thru 1N5281BUR
stabilize for 20 seconds. NOTE 3: Temperature coefficient (vz). Test conditions for temperature coefficient are as follows: a. IZT = 20 mA, T1 = 25 oC, T2 = 125 oC (1N5221AUR-1 & BUR-1 thru 1N5242AUR-1 & BUR-1) b. IZT = Rated IZT, T1 = 25 oC, T2 = 125 oC (1N5243AUR-1 & BUR-1 thru 1N5281AUR-1 & BUR-1) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. T4-LDS-0232-1, Rev. 1 (111957) (c)2011 Microsemi Corporation Page 4 of 6 1N5221BUR-1 thru 1N5281BUR-1 Pd, Rated Power Dissipation (mW) o o Temperature Coefifcient %/ C Temperature Coefficient mV/ C GRAPHS TEC TA TEC End Cap Temperature (C), or TA Ambient Temperature on FR4 PC Board Nominal Zener Voltage (Volts) FIGURE 2 ZENER VOLTAGE TEMPERATURE COEFFICIENT vs. ZENER VOLTAGE Typical Capacitance In Picofarads (pF) FIGURE 1 POWER DERATING CURVE Zener Voltage VZ FIGURE 3 CAPACITANCE vs. ZENER VOLTAGE (TYPICAL) T4-LDS-0232-1, Rev. 1 (111957) (c)2011 Microsemi Corporation Page
or 20 seconds. NOTE 3: Temperature coefficient ( vz ). Test conditions for temperature coefficient are as follows: a. I ZT = 20 mA, T 1 = 25 oC, o T 2 = 125 C (1N5221AUR-1 & BUR-1 thru 1N5242AUR-1 & BUR-1) b. I ZT = Rated I ZT , T 1 = 25 oC, T 2 = 125 oC (1N5243AUR-1 & BUR-1 thru 1N5281AUR-1 & BUR-1) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. T4-LDS-0232-1, Rev. 1 (111957) (c)2011 Microsemi Corporation Page 4 of 6 1N5221BUR-1 thru 1N5281BUR-1 Temperature Coefficient mV/oC Temperature Coefifcient %/oC Pd, Rated Power Dissipation (mW) GRAPHS TEC TA T EC End Cap Temperature (C), or TA Ambient Temperature on FR4 PC Board Nominal Zener Voltage (Volts) FIGURE 2 ZENER VOLTAGE TEMPERATURE COEFFICIENT vs. ZENER VOLTAGE Typical Capacitance In Picofarads (pF) FIGURE 1 POWER DERATING CURVE Zener Voltage V Z FIGURE 3 CAPACITANCE vs. ZENER VOLTAGE (TYPICAL) T4-LDS-0232-1, Rev. 1 (111957) (c)2011 Microsemi Corporation Page 5
device to stabilize for 20 seconds. Temperature coefficient (vz). Test conditions for temperature coefficient are as follows: a. IZT = 7.5 mA, T1 = 25oC, T2 = 125oC (1N5221AUR-1 & BUR-1 thru 1N5242AUR-1 & BUR-1) IZT = Rated IZT, T1 = 25oC, b. T2 = 125oC (1N5243AUR-1 & BUR-1 thru 1N5281AUR-1 & BUR-1) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. These devices may be ordered as either 1N5221UR-1 thru 1N5281BUR-1 or as MLL5221-1 thru MLL5281B-1 part numbers. RATED POWER -mW o TEMPERATURE COEFFICIENT mV/ C TEMPERATURE COEFFICIENT %/ C GRAPHS TEC TA Voltage Temperature o Coefficient %/ C mV Change /C o TEC End Cap Temperature (C), or TA Ambient Temperature on FR4 PC BOARD NOMINAL ZENER VOLTAGE (VOLTS) FIGURE 2 ZENER VOLTAGE TEMPERATURE COEFFICIENT vs. ZENER VOLTAGE FIGURE 1 POWER DERATING CURVE PACKAGE DIMENSIONS DIM A B C INCHES MIN MAX 0.063 0.067 0.130 0.146 0.016 0.022 INCHES .200 .055 .080 1N5221UR thru 1N5281BUR